型號

盒(根)

產品描述

SSS-SEIH

10

Silicon cantilever for non-contact/tapping

-mode,special type A,

with SUPERSHARPSILICON tip

20

50

SSS-SEIHR

10

Silicon cantilever for non-contact/tapping

-mode,special type A,

with SUPERSHARPSILICON tip

detector side : Al-coating

20

50

qp-CONT

10

生物探針，懸臂梁: 共振頻率11kHz 力常數 0.01 N/m; 應用范圍：生物探針、液體探針；優勢：力常數和共振頻率波動范圍小，特別適用于的定量納米力學研究和生物測試

20

50

qp-SCONT

10

生物探針，懸臂梁: 共振頻率11kHz 力常數 0.01 N/m; 應用范圍：生物探針、液體探針；優勢：力常數和共振頻率波動范圍小，特別適用于的定量納米力學研究和生物測試

20

50

PtSi-CONT

10

導電探針，鍍層: 鉑硅； 比常規導電探針更耐磨，電學信號更長久，重復性好、分辨率高。應用范圍：導電探針

20

50

ATEC-CONT

10

接觸模式硅探針

20

50

ATEC-CONTPt

10

接觸模式硅探針，鍍層：Pt/Ir

20

50

ATEC-CONTAu

10

接觸模式探針，臂梁及針尖鍍層：鍍金

ppp-CONT

10

接觸模式探針，

20

50

PPP-CONT-W

380

PPP-CONTR

10

接觸模式探針，鍍層：Al

20

50

PPP-CONTR-W

380

PPP-XYCONTR

10

接觸模式探針，鍍層：Al ,XY-auto aligment

20

50

PPP-CONTPt

10

Silicon cantilever for contact mode,  detector side :Pt/Ir-coating ,tip side : Pt/Ir-coating

20

50

PPP-CONTPt-W

380

PPP-CONTAu

10

Silicon cantilever for contact mode,  detector and tip side : Au-coating

PPP-CONTAuD

10

Silicon cantilever for contact mode,  detector side : Au-coating

DT-CONTR

10

金剛石探針，接觸模式，鍍層：Al

20

50

CDT-CONTR

10

導電金剛石探針，接觸模式，鍍層：Al

20

50

PPP-ZEILR

10

silicon cantilever for contact mode, special type, detector side :Al-coating

20

50

PPP-ZEILR-W

380

PPP-RT-CONTR

10

silicon cantilever for contact mode, tip rotated by 180°,detector side :Al-coating

20

50

PL2-CONT

10

Silicon-SPM-Probe with plateau tip, silicon cantilever for contact mode,

PL2-CONTR

10

Silicon-SPM-Probe with plateau tip, silicon cantilever for contact mode, detector side: Al-coating

TL-CONT

10

Tipless silicon cantilever based on POINTPROBE technology

20

50

PPP-CONTSC

10

silicon cantilever for contact mode, short cantilever

20

50

PPP-CONTSCR

10

silicon cantilever for contact mode, short cantilever, detector side :Al-coating

20

50

PPP-CONTSCR-W

380

PPP-CONTSCPt

10

silicon cantilever for contact mode, short cantilever, detector side :Pt/Ir-coating

20

50

PPP-CONTSCAu

10

silicon cantilever for contact mode, short cantilever, detector and tip side :Au-coating

PPP-CONTSCAuD

10

silicon cantilever for contact mode, short cantilever, detector side :Au-coating

PtSi-FM

10

導電探針，鍍層: 鉑硅； 比常規導電探針更耐磨，電學信號更長久，重復性好、分辨率高。應用范圍：導電探針

20

50

ATEC-FM

10

軟輕敲探針，鍍層: 無； 針尖可視的探針，可應用到對于那些針尖需要被精確定位或必須針尖可見的應用（例如，用于納米操作）來說，ATEC是必然的首選。由于其超小的半錐角尖端，ATEC系列產品在陡峭的小尺寸圖案樣品測量中表現出很好的性能. Silicon cantilever for force modulation mode,

20

50

ATEC-EFM

10

Silicon cantilever for force modulation mode, detector and tip side:Pt/Ir-coating

20

50

ATEC-FMAu

10

Silicon cantilever for force modulation mode, detector and tip side:Au-coating

PPP-LFMR

10

Silicon cantilever for lateral/friction force microscopy,detector side: Al-coating

20

50

PPP-LFMR-W

380

PPP-FM

10

Silicon cantilever for force modulation mode,

20

50

PPP-FM-W

380

PPP-FMR

10

Silicon cantilever for force modulation mode, detector side:Al-coating

20

50

PPP-FMR-W

380

PPP-FMAu

10

Silicon cantilever for force modulation mode,

detector and tip side: Au-coating

PPP-FMAuD

10

Silicon cantilever for force modulation mode,

detector  side: Au-coating

PPP-QFMR

10

Silicon cantilever for force modulation mode,

High quality factor for UHV applications, detector side: Al-coating

PPP-RT-FMR

10

Silicon cantilever for force modulation mode,

Tip rotated by 180°,detector side: Al-coating

20

50

PL2-FM

10

Silicon-SPM-Probe with plateau tip, Silicon cantilever for force modulation mode,

PL2-FMR

10

Silicon-SPM-Probe with plateau tip, Silicon cantilever for force modulation mode, detector side:Al-coating

TL-FM

10

Tipless silicon cantilever based on POINTPROBE technology

20

50

SSS-FM

10

Silicon cantilever for force modulation mode,

With SUPERSHARPSILICON tip

20

50

SSS-FMR

10

Silicon cantilever for force modulation mode,

With SUPERSHARPSILICON tip,

detector side:Al-coating

20

50

DT-FMR

10

金剛石探針，Silicon cantilever for force modulation mode, 鍍層：Al

20

50

CDT-FMR

10

導電金剛石探針，Silicon cantilever for force modulation mode, 鍍層：Al

20

50

PPP-EFM

10

Silicon cantilever for electrostatic force Microscopy, detector side:Pt/Ir-coating , tip side: Pt/Ir-coating

20

50

PPP-EFM-W

370

PPP-MFMR

10

Silicon cantilever for Magnetic force Microscopy, detector side:Al-coating , tip side: hard magnetic coating

20

50

PPP-MFMR-W

370

PPP-LM-MFMR

10

Silicon cantilever for Magnetic force Microscopy, Low Moment ,detector side:Al-coating , tip side: hard magnetic coating

20

50

PPP-LC-MFMR

10

Silicon cantilever for Magnetic force Microscopy, Low Coercivity ,detector side:Al-coating , tip side: hard magnetic coating

20

50

PPP-QLC-MFMR

10

Silicon cantilever for Magnetic force Microscopy, Low Coercivity ,high quality factor for UHV applications,detector side:Al-coating , tip side: hard magnetic coating

SSS-MFMR

10

Silicon cantilever for high resolution Magnetic force Microscopy, detector side:Al-coating , tip side: hard magnetic coating

20

50

SSS-QMFMR

10

Silicon cantilever for Magnetic force Microscopy, ,high quality factor for UHV applications,detector side:Al-coating , tip side: hard magnetic coating

2D200

1

CALIBRATION STANDARD for x-y calibration of the scanning mechanism,lattice of inverted pyramids,200nm pitch

2D300

1

CALIBRATION STANDARD for x-y calibration of the scanning mechanism,lattice of inverted pyramids,300nm pitch

H8

1

HEIGHT STANDARD for very precise z-calibration,nominal step height: 8nm

FLAT

1

FLATNESS STANDARD for analysis and correction of the scanner bow,smooth plane with a maximum peak to valley distance of 10nm on a 100x100u㎡ area